X-ray Spectroscopy
RaySpec has a long history in producing Silicon based energy dispersive x-ray detector systems for x-ray spectroscopy applications using synchrotron radiation, conventional x-ray tube or charged particle beam excitation. Previously known as SGX Sensortech, e2v scientific instruments and Gresham Scientific Instruments, RaySpec produces Silicon drift Detectors (SDD) from standard designs through customised assemblies to complex multi-element detectors. All detectors are designed to deliver the highest specifications in energy resolution, peak to background ratio and throughput in addition to meeting our own exceptional standards of engineering quality.
EDS Detectors for Electron Microscopy
E
DS is an invaluable technique providing elemental composition information in direct relation to the Electron Microscope image for both Scanning Electron Microscopes (SEM) and Transmission Electron Microscopes (TEM). RaySpec has a wealth of experience in the design and manufacture of energy dispersive x-ray detectors used for EDS (Energy Dispersive Spectroscopy) on both SEMs and TEMs.
XRF Detectors for Materials Analysis
X-Ray Fluorescence (XRF) is widely used technique for materials analysis in industrial quality control, raw material analysis and research applications. RaySpec are found in commercial and research XRF systems worldwide.
X-Ray Spectroscopy for Beam Line Research
RaySpec manufactures high quality x-ray spectrometers for specialist applications which utilise excitation from beam lines on synchrotrons or charged particle accelerators. Detectors offered range from single sensor products through to complex customised multi-sensor designs to suit all applications.
Downlaod a brochure for an overview of the SDD detectors and design capabilities of RaySpec Ltd